How fast is our Vector DSPM? We imaged a 1×1 μm area of polished silicon in just 0.5 seconds. A traditional premium AFM that is widely used in the semiconductor industry took 8.5 minutes for the same scan—and with lower pixel density.
Same surface roughness (200 pm), but 1000× faster. That’s the power of in-line nanometrology.
Ready to bring nanoscale quality control onto the production line? Let’s talk.
