We see a strong synergy between electron microscopes and scanning probe microscopes, with both playing a crucial role in mapping crystallographic and physical structure changes caused by stress, strain, and plastic deformation in metals.
Our Vector Scanning Probe Microscope is designed to integrate seamlessly into existing sample analysis workflows, working alongside tools like EBSD to provide complementary and valuable insights into material behavior.
(For those interested the image bellow shows the slip bands in steel after plastic deformation collected on Vector)
We look forward to exploring ways to collaborate and bring a more complete picture to failure analysis and materials science.
